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A simple non-destructive technique to detect micropipes in silicon carbide

Lookup NU author(s): Dominique Morrison, Dr Christopher Johnson

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Abstract

An initial investigation has shown that the electrolysis of water can occur preferentially at macroscopic defects, including micropipes, where a silicon carbide wafer is used as the anode. It is proposed that observing the location of the resulting streams of bubbles, nucleated at the defects, would form the basis for a simple, non-destructive qualification test of SiC wafers.

Publication metadata

Author(s): Morrison DJ, Keir A, Preston IH, Hilton KP, Uren MJ, Johnson CM

Publication type: Article

Publication status: Published

Journal: Materials Science Forum

Year: 2000

Volume: 353-356

Pages: 303-306

Print publication date: 01/01/2000

ISSN (print): 0255-5476

ISSN (electronic):

Publisher: Trans Tech Publications

URL: http://dx.doi.org/10.4028/www.scientific.net/MSF.353-356.303

DOI: 10.4028/www.scientific.net/MSF.353-356.303

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