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The Newcastle University research output collection, currently available on ePrints, will shortly be moving to a new open repository platform, Figshare. To prepare for the data migration we have paused adding new content to ePrints, and will resume once the new repository is launched. During this time you will continue to have access to ePrints (but no new content will appear). We will share updates here when available.

Impact of Ge diffusion and wafer cross hatching on strained Si MOSFET electrical parameters

Lookup NU author(s): Luke Driscoll, Dr Sarah OlsenORCiD, Dr Sanatan Chattopadhyay, Professor Anthony O'Neill, Dr Kelvin Kwa

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Publication metadata

Author(s): Driscoll LS, Olsen S, Chattopadhyay S, O'Neill AG, Kwa K

Publication type: Conference Proceedings (inc. Abstract)

Publication status: Published

Conference Name: International Conference on Materials Research Symposium (MRS)

Year of Conference: 2004


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