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X-ray induced decomposition of gold nitride

Lookup NU author(s): Dr Yuriy Butenko, Luís Alves, Dr Abel Brieva, Professor Jianhua Yang, Satheesh Krishnamurthy, Professor Lidija SillerORCiD

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Abstract

Gold films containing gold nitride have been produced by nitrogen reactive ion sputtering and characterized by X-ray photoemission spectroscopy. N1s core-level spectra from the films show a peak at 397.0 ± 0.2 eV attributed to gold nitride species. The intensity of the nitride peak decays with measurement time, demonstrating that this material decomposes under X-ray irradiation. Atomic force microscopy shows that the nitride containing films are also sensitive to electron beam irradiation, indicating that X-ray or electron beam lithography may be used to directly write patterns on a gold nitride surface. © 2006.

Publication metadata

Author(s): Butenko YuV, Alves L, Brieva AC, Yang J, Krishnamurthy S, Siller L

Publication type: Article

Publication status: Published

Journal: Chemical Physics Letters

Year: 2006

Volume: 430

Issue: 1-3

Pages: 89-92

ISSN (print): 0009-2614

ISSN (electronic): 1873-4448

Publisher: Elsevier BV

URL: http://dx.doi.org/10.1016/j.cplett.2006.08.096

DOI: 10.1016/j.cplett.2006.08.096

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