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The Newcastle University research output collection, currently available on ePrints, will shortly be moving to a new open repository platform, Figshare. To prepare for the data migration we have paused adding new content to ePrints, and will resume once the new repository is launched. During this time you will continue to have access to ePrints (but no new content will appear). We will share updates here when available.

Modeling Dopant Diffusion in Strained and Strain-Relaxed Epi-SiGe

Lookup NU author(s): Dr Shibin Liu, Professor Nick Cowern

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Publication metadata

Author(s): Sheu YM, Huang TY, Hu YP, Wang CC, Liu S, Duffy R, Heringa A, Roozeboom F, Cowern NEB, Griffin PB

Publication type: Conference Proceedings (inc. Abstract)

Publication status: Published

Conference Name: International Conference on Simulation of Semiconductor Processes and Devices

Year of Conference: 2005

Pages: 75-78

Publisher: IEEE

URL: http://dx.doi.org/10.1109/SISPAD.2005.201476

DOI: 10.1109/SISPAD.2005.201476

Library holdings: Search Newcastle University Library for this item

ISBN: 4990276205


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