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The Newcastle University research output collection, currently available on ePrints, will shortly be moving to a new open repository platform, Figshare. To prepare for the data migration we have paused adding new content to ePrints, and will resume once the new repository is launched. During this time you will continue to have access to ePrints (but no new content will appear). We will share updates here when available.

Wafer Region Yield Prediction: Employing Majority Under-Sampling and Output Binarization on Low-Yield Threshold

Lookup NU author(s): Dr Aastha Sharma, Professor Cheng ChinORCiD

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This work is licensed under a Creative Commons Attribution 4.0 International License (CC BY 4.0).


Publication metadata

Author(s): Lim MYS, Sharma A, Chin CS

Publication type: Article

Publication status: Published

Journal: IEEE Access

Year: 2025

Volume: 13

Pages: 55104-55112

Print publication date: 03/04/2025

Online publication date: 26/03/2025

Acceptance date: 21/03/2025

Date deposited: 08/04/2025

ISSN (electronic): 2169-3536

Publisher: IEEE

URL: https://doi.org/10.1109/ACCESS.2025.3554525

DOI: 10.1109/ACCESS.2025.3554525


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