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The Newcastle University research output collection, currently available on ePrints, will shortly be moving to a new open repository platform, Figshare. To prepare for the data migration we have paused adding new content to ePrints, and will resume once the new repository is launched. During this time you will continue to have access to ePrints (but no new content will appear). We will share updates here when available.

Effect of annealing on interface state density of Ni-silicided Si1-xGex Schottky diodes

Lookup NU author(s): Arup Saha, Dr Sanatan Chattopadhyay

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Publication metadata

Author(s): Saha AR, Chattopadhyay S, Maiti CK

Publication type: Article

Publication status: Published

Journal: Materials Science in Semiconductor Processing

Year: 2004

Volume: 8

Issue: 1-3

Pages: 249-253

ISSN (print): 1369-8001

ISSN (electronic): 1873-4081

Publisher: Pergamon

URL: http://dx.doi.org/10.1016/j.mssp.2004.09.042

DOI: 10.1016/j.mssp.2004.09.042


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