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The Newcastle University research output collection, currently available on ePrints, will shortly be moving to a new open repository platform, Figshare. To prepare for the data migration we have paused adding new content to ePrints, and will resume once the new repository is launched. During this time you will continue to have access to ePrints (but no new content will appear). We will share updates here when available.

An Analysis of SEU Robustness of C-Element Structures Implemented in Bulk CMOS and SOI Technologies

Lookup NU author(s): Dr Gordon Russell, Professor Alex YakovlevORCiD

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Publication metadata

Author(s): Al-Tarawneh Z, Russell G, Yakovlev A

Publication type: Conference Proceedings (inc. Abstract)

Publication status: Published

Conference Name: 22nd International Conference on Microelectronics (ICM)

Year of Conference: 2010

Pages: 280-283

Publisher: IEEE

URL: http://dx.doi.org/10.1109/ICM.2010.5696138

DOI: 10.1109/ICM.2010.5696138

Library holdings: Search Newcastle University Library for this item

ISBN: 9781612841496


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