Toggle Main Menu Toggle Search

Open Access padlockePrints

The Newcastle University research output collection, currently available on ePrints, will shortly be moving to a new open repository platform, Figshare. To prepare for the data migration we have paused adding new content to ePrints, and will resume once the new repository is launched. During this time you will continue to have access to ePrints (but no new content will appear). We will share updates here when available.

Impact ionization in ion implanted 4H-SiC photodiodes

Lookup NU author(s): Dr Konstantin VasilevskiyORCiD, Irina Nikitina, Professor Nick WrightORCiD, Dr Christopher Johnson

Downloads

Full text for this publication is not currently held within this repository. Alternative links are provided below where available.

Abstract

Hole dominated avalanche multiplication and thus breakdown characteristics of ion implanted 4H-SiC p+-n--n+ photodiodes were determined by means of photomultiplication measurements using 325 nm UV light. All the tested diodes exhibited low reverse leakage current and reasonably uniform avalanche breakdown. With avalanche widths of 0.2 μm to 1.5 μm and the capability to measure multiplication factor as low as 1.001, the room temperature impact ionization coefficients were precisely deduced from these 4H-SiC diodes using a local ionization model for electric fields ranging from 1.25 MV/cm to 2.8 MV/cm. The results agree with those reported by Ng et al. and are within the accuracy of both the C-V measurements and electric-field determinations. © 2008 Materials Research Society.

Publication metadata

Author(s): Loh WS, Goh EZJ, Vassilevski K, Nikitina I, David JPR, Wright NG, Johnson CM

Publication type: Conference Proceedings (inc. Abstract)

Publication status: Published

Conference Name: Materials Research Society Symposium Proceedings: Silicon Carbide - Materials, Processing and Devices

Year of Conference: 2008

Pages: 245-250

ISSN: 0272-9172

Publisher: Materials Research Society

Library holdings: Search Newcastle University Library for this item

ISBN: 9781605110394

Share