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The Newcastle University research output collection, currently available on ePrints, will shortly be moving to a new open repository platform, Figshare. To prepare for the data migration we have paused adding new content to ePrints, and will resume once the new repository is launched. During this time you will continue to have access to ePrints (but no new content will appear). We will share updates here when available.

Capacitance-voltage (C-V) technique for the characterisation of strained Si/Si1-xGex hetero-structure MOS devices

Lookup NU author(s): Dr Sanatan Chattopadhyay, John Varzgar, Dr Johan Seger, Dr Yuk Tsang, Dr Kelvin Kwa, Dr Sarah OlsenORCiD, Professor Anthony O'Neill

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Publication metadata

Author(s): Chattopadhyay S, Varzgar JB, Seger J, Tsang YL, Kwa KSK, Olsen SH, O'Neill AG

Publication type: Conference Proceedings (inc. Abstract)

Publication status: Published

Conference Name: International Conference on Electronic and Photonic Material, Devices and Systems (EPMDS 2006)

Year of Conference: 2006

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